Incident Polarization Independence of Topographic Artifacts in Scattering-Type Near-Field Microscopy
Joonmo Ahn, Sungjin Chang, Young-Jun Yu and Wonho Jhe, ”Incident Polarization Independence of Topographic Artifacts in Scattering-Type Near-Field Microscopy”, Jpn. J. Appl. Phys. 47 (6), 4839-4842 (2008)