Artifacts identification in apertureless near-field optical microscopy
Pietro Gucciardi, Guillaume Bachelier, Maria Allegrini, J. Ahn, M. Hong, S. Chang, W. Jhe, S. -C. Hong, S. H. Baek, ”Artifacts identification in apertureless near-field optical microscopy”, J. Appl. Phys. 101 (6), 064303 (2007)